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- W1538095938 abstract "In conjunction with various photophysical processes the charge transport largely determines the performance of electronic devices. In the past a vast number of techniques have been used to study transport in various types of semiconductors. Although some techniques are relatively simple to use, the interpretation of results is not so straightforward. Therefore, it is important to understand the limitations and applicability of these techniques when measuring the charge carrier mobility and recombination. In this work, the most commonly used charge transport techniques are presented. The advantages and disadvantages of time-of-flight (TOF), xerographic discharge (XTOF) and charge extraction by linearly increasing voltage (CELIV) techniques are discussed in detail. Various possible and technique-specific experimental conditions are used to demonstrate the quirks of each technique. It is shown how experimental data obtained using these techniques represent the charge carrier transport and how the results compare. Dispersive charge transport models in the framework of Gaussian density-of-states are used to explain the observed features of charge transport in disordered organic semiconductors." @default.
- W1538095938 created "2016-06-24" @default.
- W1538095938 creator A5057043675 @default.
- W1538095938 creator A5087653720 @default.
- W1538095938 date "2013-01-01" @default.
- W1538095938 modified "2023-10-14" @default.
- W1538095938 title "Charge transport features in disordered organic materials measured by time-of-flight (TOF), xerographic discharge (XTOF) and charge extraction by linearly increasing voltage (CELIV) techniques" @default.
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- W1538095938 doi "https://doi.org/10.1533/9780857098764.2.398" @default.
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