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- W1539684662 abstract "Results from total dose and single event effects testing of a UTMC Microelectronic Systems Commercial RadHard/sup TM/ gate array standard evaluation circuit (SEC) are reported. Total dose levels up to 300 krad(Si) and error rates of less than 1/spl times/10/sup -10/ errors/bit-day, with no single event latch-up (SEL), were demonstrated. Results from total dose testing of capacitor test structures from AMI's 0.6 /spl mu/m mixed signal process are also reported, indicating the possibility of greater than 200 krad(Si) total dose hardness for 0.6 /spl mu/m CMOS when processed with the UTMC Commercial RadHard/sup TM/ process module." @default.
- W1539684662 created "2016-06-24" @default.
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- W1539684662 date "2002-11-27" @default.
- W1539684662 modified "2023-09-23" @default.
- W1539684662 title "Total dose and single event effects testing of UTMC commercial RadHard/sup TM/ gate arrays" @default.
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- W1539684662 doi "https://doi.org/10.1109/redw.1998.731481" @default.
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