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- W1544641336 abstract "The low power application of DRAMs requires longer data retention time. Since the p-n junction current leakage is the main cause of the cell capacitor discharge, the leakage should be minimized to meet the requirement. However, the leakage taking place in a small area varies from bit to bit. Therefore, it is necessary to clarify the mechanism of the variation for the leakage minimization. A physical model, based on newly obtained experimental results, is proposed wherein the leakage variation is mainly due to a variation of local electric field strength enhancement." @default.
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- W1544641336 date "2002-11-19" @default.
- W1544641336 modified "2023-09-27" @default.
- W1544641336 title "Physical model of bit-to-bit variation in data retention time of DRAMs" @default.
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- W1544641336 doi "https://doi.org/10.1109/drc.1995.496313" @default.
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