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• W1555654335 abstract "Low-frequency (1/f) noise has been characterized for the first time in TFSOI BiCMOS devices designed for low power high frequency applications. In the bipolar transistors, 1/f noise obeyed a square law dependence on base current and was proportional to the inverse of the area. Aside from the expected 1/f noise, we have also observed a bias dependent generation-recombination (G/R) noise component in a small portion of these TFSOI BJTs. The 1/f noise in the near-fully-depleted MOSFETs was found to be bias independent in both the linear and saturation region of operation. However, when operated in the subthreshold regime, extraneous generation-recombination (G/R) noise becomes apparent." @default.
• W1555654335 created "2016-06-24" @default.
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• W1555654335 date "2002-12-24" @default.
• W1555654335 modified "2023-09-25" @default.
• W1555654335 title "Low-frequency noise dependence of TFSOI BiCMOS for low power RF mixed-mode applications" @default.
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• W1555654335 doi "https://doi.org/10.1109/iedm.1996.553139" @default.
• W1555654335 hasPublicationYear "2002" @default.
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