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- W1555974256 abstract "Energy dispersive X-ray reflectivity is a versatile tool for analyzing thin film structures. Layer thickness, interface roughness and composition can be determined with a single non-destructive measurement. Use of energy dispersive detection enables spectra to be acquired in less than 500 s with a rotating anode X-ray generator, making the study of kinetics possible." @default.
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- W1555974256 date "1995-07-01" @default.
- W1555974256 modified "2023-09-24" @default.
- W1555974256 title "Energy dispersive X-ray reflectivity characterization of semiconductor heterostructures and interfaces" @default.
- W1555974256 hasPublicationYear "1995" @default.
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