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- W1562164757 abstract "An analysis of long-duration TLP stress will be performed on ESD clamps representative of the mo commonly used ESD protection strategies. It will be shown that snapback-based High Voltage devices featur static filamentary conduction after triggering. This leads to failure for TLP pulse widths in excess of 100ns, we below the expected power scaling levels. The need for long TLP testing to establish ESD protection robustnes in the system level stress regime will be demonstrated." @default.
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- W1562164757 date "2010-11-09" @default.
- W1562164757 modified "2023-09-28" @default.
- W1562164757 title "The relevance of long-duration TLP stress on system level ESD design" @default.
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