FRINK Linked Data Fragments server

Matches in SemOpenAlex for { <https://semopenalex.org/work/W1563172564> ?p ?o ?g. }

• W1563172564 abstract "Recent work is reviewed that shows that MOS and bipolar device radiation response can change significantly with aging time after device fabrication and/or packaging. Effects include changes in radiation response due to burn-in, pre-irradiation elevated temperature stress, and/or long-term storage. These changes are attributed experimentally and theoretically to the motion and reactions of water and other hydrogen-related species. Similar hydrogen-related reactions can also affect the long-term reliability of MOS devices and integrated circuits, as illustrated in detail here for negative-bias temperature instability" @default.
• W1563172564 created "2016-06-24" @default.
• W1563172564 creator A5001195247 @default.
• W1563172564 creator A5013809531 @default.
• W1563172564 creator A5049822123 @default.
• W1563172564 creator A5052765075 @default.
• W1563172564 creator A5063324190 @default.
• W1563172564 creator A5075909473 @default.
• W1563172564 creator A5077906043 @default.
• W1563172564 creator A5079321569 @default.
• W1563172564 date "2006-07-21" @default.
• W1563172564 modified "2023-09-27" @default.
• W1563172564 title "Effects of Device Aging on Microelectronics Radiation Response and Reliability" @default.
• W1563172564 cites W1626161525 @default.
• W1563172564 cites W1628015465 @default.
• W1563172564 cites W1967389183 @default.
• W1563172564 cites W1988708051 @default.
• W1563172564 cites W1989606734 @default.
• W1563172564 cites W1991891926 @default.
• W1563172564 cites W2026328223 @default.
• W1563172564 cites W2029707735 @default.
• W1563172564 cites W2037752059 @default.
• W1563172564 cites W2040091297 @default.
• W1563172564 cites W2041424982 @default.
• W1563172564 cites W2048903167 @default.
• W1563172564 cites W2050493779 @default.
• W1563172564 cites W2069208322 @default.
• W1563172564 cites W2078999684 @default.
• W1563172564 cites W2085696127 @default.
• W1563172564 cites W2086693906 @default.
• W1563172564 cites W2089678938 @default.
• W1563172564 cites W2093871741 @default.
• W1563172564 cites W2098184705 @default.
• W1563172564 cites W2098310328 @default.
• W1563172564 cites W2098356066 @default.
• W1563172564 cites W2101861514 @default.
• W1563172564 cites W2104925939 @default.
• W1563172564 cites W2115343518 @default.
• W1563172564 cites W2117504991 @default.
• W1563172564 cites W2131004284 @default.
• W1563172564 cites W2134337228 @default.
• W1563172564 cites W2148657785 @default.
• W1563172564 cites W2149217004 @default.
• W1563172564 cites W2152767388 @default.
• W1563172564 cites W2159675689 @default.
• W1563172564 cites W2160319990 @default.
• W1563172564 cites W2169190362 @default.
• W1563172564 cites W2179156814 @default.
• W1563172564 cites W2269651387 @default.
• W1563172564 cites W2986269454 @default.
• W1563172564 doi "https://doi.org/10.1109/icmel.2006.1650901" @default.
• W1563172564 hasPublicationYear "2006" @default.
• W1563172564 type Work @default.
• W1563172564 sameAs 1563172564 @default.
• W1563172564 citedByCount "1" @default.
• W1563172564 countsByYear W15631725642019 @default.
• W1563172564 crossrefType "proceedings-article" @default.
• W1563172564 hasAuthorship W1563172564A5001195247 @default.
• W1563172564 hasAuthorship W1563172564A5013809531 @default.
• W1563172564 hasAuthorship W1563172564A5049822123 @default.
• W1563172564 hasAuthorship W1563172564A5052765075 @default.
• W1563172564 hasAuthorship W1563172564A5063324190 @default.
• W1563172564 hasAuthorship W1563172564A5075909473 @default.
• W1563172564 hasAuthorship W1563172564A5077906043 @default.
• W1563172564 hasAuthorship W1563172564A5079321569 @default.
• W1563172564 hasConcept C118820876 @default.
• W1563172564 hasConcept C119599485 @default.
• W1563172564 hasConcept C120665830 @default.
• W1563172564 hasConcept C121332964 @default.
• W1563172564 hasConcept C127413603 @default.
• W1563172564 hasConcept C136525101 @default.
• W1563172564 hasConcept C138885662 @default.
• W1563172564 hasConcept C142724271 @default.
• W1563172564 hasConcept C153385146 @default.
• W1563172564 hasConcept C159985019 @default.
• W1563172564 hasConcept C163258240 @default.
• W1563172564 hasConcept C165801399 @default.
• W1563172564 hasConcept C172385210 @default.
• W1563172564 hasConcept C178790620 @default.
• W1563172564 hasConcept C185592680 @default.
• W1563172564 hasConcept C187937830 @default.
• W1563172564 hasConcept C192562407 @default.
• W1563172564 hasConcept C200601418 @default.
• W1563172564 hasConcept C204787440 @default.
• W1563172564 hasConcept C21036866 @default.
• W1563172564 hasConcept C2778309119 @default.
• W1563172564 hasConcept C2778413303 @default.
• W1563172564 hasConcept C41895202 @default.
• W1563172564 hasConcept C43214815 @default.
• W1563172564 hasConcept C49040817 @default.
• W1563172564 hasConcept C512968161 @default.
• W1563172564 hasConcept C557185 @default.
• W1563172564 hasConcept C62520636 @default.
• W1563172564 hasConcept C71924100 @default.
• W1563172564 hasConceptScore W1563172564C118820876 @default.
• W1563172564 hasConceptScore W1563172564C119599485 @default.
• W1563172564 hasConceptScore W1563172564C120665830 @default.
• W1563172564 hasConceptScore W1563172564C121332964 @default.
• W1563172564 hasConceptScore W1563172564C127413603 @default.
• W1563172564 hasConceptScore W1563172564C136525101 @default.

• next