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- W1565593134 abstract "Near-field scanning has often been used to measure and characterize magnetic fields surrounding individual integrated circuits (IC) and high speed digital electronic circuits. The paper describes the use of near-field scanning data, performed in a typical laboratory bench top environment, to predict radiated electromagnetic interference (EMI) in a typical product environment. The product environment may include enclosures and apertures. The approach begins by acquiring sufficient near-field scanning data to allow representation of an unintentional radiating source by an equivalent surface current distribution. The equivalent current distribution is used as a source in numerical full wave modeling. The agreement between direct full wave simulation results and full wave simulation results using equivalent sources works well under certain assumptions." @default.
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- W1565593134 date "2004-11-13" @default.
- W1565593134 modified "2023-10-06" @default.
- W1565593134 title "Using near-field scanning to predict radiated fields" @default.
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- W1565593134 doi "https://doi.org/10.1109/isemc.2004.1349988" @default.
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