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- W1566339227 abstract "We report a first study of hot-carrier degradation (HCD) in graphene field-effect transistors (GFETs). Our results show that HCD in GFETs is recoverable, similarly to the bias-temperature instability (BTI). Depending on the top gate bias polarity, the presence of HCD may either accelerate or suppress BTI. Contrary to BTI, which mainly results in a change of the charged trap density in the oxide, HCD also leads to a mobility degradation which strongly correlates with the magnitude of the applied stress." @default.
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- W1566339227 date "2015-04-01" @default.
- W1566339227 modified "2023-10-01" @default.
- W1566339227 title "Hot-carrier degradation in single-layer double-gated graphene field-effect transistors" @default.
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- W1566339227 doi "https://doi.org/10.1109/irps.2015.7112834" @default.
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