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• W1566743721 abstract "The basic purpose of the x-ray trace element analytical techniques is to detect with high sensitivity elemental constituents of the target (including elements in trace amounts) and determine quantitatively the elemental composition of the investigated sample. These techniques are based on the detection of x-rays following the atomic inner shell ionization. An inner shell (core) electron can be removed from the atom in different ways, for the analytical purposes x-ray absorption and proton scattering are most commonly used. In the case of X-Ray Fluorescence (XRF) method the x-ray tube is usually applied to irradiate the sample while in the case of Proton Induced X-ray Emission (PIXE) the proton beam accelerated by the electrostatic accelerator to typical energy of MeV is used to ionize the target atoms. The atom with a hole in the inner shell (core hole) is extremely unstable with characteristic lifetime in the order of 10-15 s. Consequently, the inner shell ionization is followed via subsequent x-ray or Auger electron emission. Both, PIXE and XRF method exploit the radiative decay channel. The energy of the emitted x rays is given by the energy difference of the electron states involved in the transition which is characteristic of the target element atomic number. In order to identify the elemental composition of the target, energy analysis of the emitted radiation is required with energy resolution high enough to resolve characteristic spectral contributions from different elements in the sample. Such resolution is achieved by the energy dispersive solid state detectors in which electric signals are proportional to the incident x-ray energy and they are commonly used in x-ray trace element analytical techniques. Besides good enough energy resolution they also provide an excellent efficiency, which is crucial to collect weak signals from trace elements in the sample. It was in fact the development of the semiconductor detectors in the seventies that has triggered the development of x-ray analytical techniques. Today both PIXE and XRF techniques being a multi-element, sensitive, fast, non destructive and relatively inexpensive, have established as a routine analytical tool in a variety of fields such as material analysis, environmental and biomedical research, archeological and art studies,... However, in some special cases the energy resolution of solid state energy dispersive detectors, nowadays reaching the order of 130 – 150 eV for the x-ray energies of few keV, is not enough and significantly higher energy resolution is required to enhance the analytical capabilities of the x-ray techniques. In order to increase further the energy resolution of x-" @default.
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• W1566743721 date "2012-02-01" @default.
• W1566743721 modified "2023-10-02" @default.
• W1566743721 title "Application of Wavelength Dispersive X-Ray Spectroscopy in X-Ray Trace Element Analytical Techniques" @default.
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• W1566743721 doi "https://doi.org/10.5772/28923" @default.
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