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- W1567152744 abstract "This work is devoted to the theoretical study and computational modeling of hot electron transport and interband breakdown in a semiconductor with the Kane band dispersion law and highly degenerate hole distribution. The majority carriers in this material are holes, but as a high electric field is applied to it, the temperature of electrons and their contribution into the current increase greatly because of small electron effective mass and their high mobility. As a result, an average electron energy can considerably exceed that of holes and even approach the ionization threshold value. Therefore in this p‐type material the interband breakdown can be caused by electron impact ionization. This is an unusual system where the ionization threshold is electric field dependent because the ionization in it takes place from the hole Fermi level which itself changes during the breakdown process. We found that a specific mechanism of S‐type NDC formation may take place in this material under breakdown conditions. The current instability is connected with the entirely Coulomb electron scattering by heavy holes." @default.
- W1567152744 created "2016-06-24" @default.
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- W1567152744 date "2007-01-01" @default.
- W1567152744 modified "2023-09-26" @default.
- W1567152744 title "Interband breakdown in a Kane semiconductor with a degenerate hole distribution" @default.
- W1567152744 doi "https://doi.org/10.1063/1.2729809" @default.
- W1567152744 hasPublicationYear "2007" @default.
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