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- W1567300851 abstract "A methodology was developed and implemented to allow silicon samples containing intentionally incorporated impurities to be fabricated into finished solar cells under carefully controlled conditions. The electrical and spectral properties were then measured for each group processed." @default.
- W1567300851 created "2016-06-24" @default.
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- W1567300851 date "1977-12-15" @default.
- W1567300851 modified "2023-09-27" @default.
- W1567300851 title "Analysis of effects of impurities intentionally incorporated into silicon" @default.
- W1567300851 hasPublicationYear "1977" @default.
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