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• W1567707009 abstract "Low frequency noise measurements were carried out using MESFET devices at different frequency and temperature ranges. The spectra obtained in the ohmic regime are due to several 1/f and generation-recombination (g-r) noise components. This method can be used as a diagnostic tool to model the nature of the time varying process and to uncover the location of the deep traps. Different trap levels were detected and the drain/gate current noise suggested as good indicators of quality of a MESFET. The theory predicts the experimentally observed trend of g-r noise dependence on both gate and drain voltages. The device structure as well as the materials from which it is composed influenced the properties of traps" @default.
• W1567707009 created "2016-06-24" @default.
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• W1567707009 date "2005-04-12" @default.
• W1567707009 modified "2023-09-26" @default.
• W1567707009 title "Generation-recombination noise characteristics of GaAs MESFETs" @default.
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• W1567707009 doi "https://doi.org/10.1109/inmic.2003.1416694" @default.
• W1567707009 hasPublicationYear "2005" @default.
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