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• W1569006287 abstract "Complementary metal-oxide-semiconductor (CMOS) image sensors (CIS) are widely used in applications such as mobile equipment, PC cameras, and portable digital cameras due to their low power consumption and low cost. Today, CIS pixel sizes are being continuously reduced, down to the 1.0 μm level in 90-nm CMOS, as industrial applications require higher pixel density. The industry requests, however, continued good performance even when the pixel dimensions are further reduced. In particular, dark current in CIS is an important parameter that determines the image performance in low light. The dark current component can change the charge capacity in photo diodes (PD) and hence the output signal as a function of location and time (J. P. Albert, 2001 and H.-S. Philip, 1998). An increase in dark current can also affect the dynamic range due to an increase in shot noise (H.Y.Cheng, 2003). By suppressing the dark current, the fixed pattern noise of the imager and the white pixel-defects can be reduced (K. A. Parulski, 1985). Photo diodes and pixel architecture of image sensors have been optimized to reduce image artifacts and hence dark current. (N. V. Loukianova, 2003; H.I.Kwon, 2004). The key technology feature for high image-quality CMOS image sensor is the formation of a low-leakage buried photodiode with a transfer gate (TG). The buried PD is a promising concept to reduce the dark current. Many researchers reported that the vicinity of the shallow-trench isolation (STI) to the PD is the main source of dark leakage. By designing and characterizing special diode test structures, H. I. Kwon et al. (2004) demonstrated that the dark leakage decreases as the distance between STI and PD increases. Takashi Watanabe et al. (2010) showed that dark current can be improvefd by avoiding charge diffusion injection from the PD to the substrate using an optimized well structure under the PD. The effects of area, perimeter, and corner on lekage were, however, not separately investigated. The buried floating diffusion (FD), on the other side of the pass transistor, was also studied by H.I.Kwon et al. (2004) and K. Mabuchi, et al. (2004). H.I.Kwon et al. (2004) explained that" @default.
• W1569006287 created "2016-06-24" @default.
• W1569006287 creator A5020860270 @default.
• W1569006287 creator A5050676039 @default.
• W1569006287 creator A5061629380 @default.
• W1569006287 creator A5070258344 @default.
• W1569006287 creator A5080187673 @default.
• W1569006287 date "2011-07-29" @default.
• W1569006287 modified "2023-10-02" @default.
• W1569006287 title "Image Artifacts by Charge Pocket in Floating Diffusion Region on CMOS Image Sensors" @default.
• W1569006287 cites W1531458851 @default.
• W1569006287 cites W1982290905 @default.
• W1569006287 cites W1984639094 @default.
• W1569006287 cites W1991381052 @default.
• W1569006287 cites W2075766605 @default.
• W1569006287 cites W2107073676 @default.
• W1569006287 cites W2108047684 @default.
• W1569006287 cites W2111543278 @default.
• W1569006287 cites W2119735034 @default.
• W1569006287 cites W2155697465 @default.
• W1569006287 cites W2163342442 @default.
• W1569006287 cites W2164867045 @default.
• W1569006287 cites W2171844129 @default.
• W1569006287 cites W2265657341 @default.
• W1569006287 cites W2284393791 @default.
• W1569006287 doi "https://doi.org/10.5772/20526" @default.
• W1569006287 hasPublicationYear "2011" @default.
• W1569006287 type Work @default.
• W1569006287 sameAs 1569006287 @default.
• W1569006287 citedByCount "0" @default.
• W1569006287 crossrefType "book-chapter" @default.
• W1569006287 hasAuthorship W1569006287A5020860270 @default.
• W1569006287 hasAuthorship W1569006287A5050676039 @default.
• W1569006287 hasAuthorship W1569006287A5061629380 @default.
• W1569006287 hasAuthorship W1569006287A5070258344 @default.
• W1569006287 hasAuthorship W1569006287A5080187673 @default.
• W1569006287 hasBestOaLocation W15690062871 @default.
• W1569006287 hasConcept C105066941 @default.
• W1569006287 hasConcept C115961682 @default.
• W1569006287 hasConcept C119599485 @default.
• W1569006287 hasConcept C120665830 @default.
• W1569006287 hasConcept C121332964 @default.
• W1569006287 hasConcept C127413603 @default.
• W1569006287 hasConcept C154945302 @default.
• W1569006287 hasConcept C155310634 @default.
• W1569006287 hasConcept C160633673 @default.
• W1569006287 hasConcept C171250308 @default.
• W1569006287 hasConcept C180651308 @default.
• W1569006287 hasConcept C192562407 @default.
• W1569006287 hasConcept C23125352 @default.
• W1569006287 hasConcept C2779227376 @default.
• W1569006287 hasConcept C41008148 @default.
• W1569006287 hasConcept C46362747 @default.
• W1569006287 hasConcept C49040817 @default.
• W1569006287 hasConcept C751236 @default.
• W1569006287 hasConcept C76935873 @default.
• W1569006287 hasConcept C78434282 @default.
• W1569006287 hasConcept C99498987 @default.
• W1569006287 hasConceptScore W1569006287C105066941 @default.
• W1569006287 hasConceptScore W1569006287C115961682 @default.
• W1569006287 hasConceptScore W1569006287C119599485 @default.
• W1569006287 hasConceptScore W1569006287C120665830 @default.
• W1569006287 hasConceptScore W1569006287C121332964 @default.
• W1569006287 hasConceptScore W1569006287C127413603 @default.
• W1569006287 hasConceptScore W1569006287C154945302 @default.
• W1569006287 hasConceptScore W1569006287C155310634 @default.
• W1569006287 hasConceptScore W1569006287C160633673 @default.
• W1569006287 hasConceptScore W1569006287C171250308 @default.
• W1569006287 hasConceptScore W1569006287C180651308 @default.
• W1569006287 hasConceptScore W1569006287C192562407 @default.
• W1569006287 hasConceptScore W1569006287C23125352 @default.
• W1569006287 hasConceptScore W1569006287C2779227376 @default.
• W1569006287 hasConceptScore W1569006287C41008148 @default.
• W1569006287 hasConceptScore W1569006287C46362747 @default.
• W1569006287 hasConceptScore W1569006287C49040817 @default.
• W1569006287 hasConceptScore W1569006287C751236 @default.
• W1569006287 hasConceptScore W1569006287C76935873 @default.
• W1569006287 hasConceptScore W1569006287C78434282 @default.
• W1569006287 hasConceptScore W1569006287C99498987 @default.
• W1569006287 hasLocation W15690062871 @default.
• W1569006287 hasLocation W15690062872 @default.
• W1569006287 hasOpenAccess W1569006287 @default.
• W1569006287 hasPrimaryLocation W15690062871 @default.
• W1569006287 hasRelatedWork W2016100573 @default.
• W1569006287 hasRelatedWork W2022712184 @default.
• W1569006287 hasRelatedWork W2026144577 @default.
• W1569006287 hasRelatedWork W2034542737 @default.
• W1569006287 hasRelatedWork W2058810976 @default.
• W1569006287 hasRelatedWork W2088707311 @default.
• W1569006287 hasRelatedWork W2094968749 @default.
• W1569006287 hasRelatedWork W2126719734 @default.
• W1569006287 hasRelatedWork W2155229401 @default.
• W1569006287 hasRelatedWork W2331008491 @default.
• W1569006287 hasRelatedWork W2598635733 @default.
• W1569006287 hasRelatedWork W2989952164 @default.
• W1569006287 hasRelatedWork W3007207366 @default.
• W1569006287 hasRelatedWork W3162809731 @default.
• W1569006287 hasRelatedWork W2227619944 @default.
• W1569006287 hasRelatedWork W2245036249 @default.
• W1569006287 hasRelatedWork W2772542329 @default.

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