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- W1569462428 abstract "Photoemissive sampling was recently introduced as a new, contactless method for probing high-speed electrical waveforms on circuits and devices on any semiconductor [1–3]. Previously the best temporal resolution achieved by this technique was limited to 40 ps. In this paper we describe photoemissive sampling experiments which demonstrate a temporal resolution of 5 ps." @default.
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- W1569462428 date "1987-01-01" @default.
- W1569462428 modified "2023-09-27" @default.
- W1569462428 title "Photoemissive Testing of High-Speed Electrical Waveforms" @default.
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- W1569462428 doi "https://doi.org/10.1007/978-3-642-72970-6_12" @default.
- W1569462428 hasPublicationYear "1987" @default.
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