Matches in SemOpenAlex for { <https://semopenalex.org/work/W1569555474> ?p ?o ?g. }
Showing items 1 to 85 of
85
with 100 items per page.
- W1569555474 abstract "A circuit-level testability comparison of bipolar, CMOS and BiCMOS logic technologies is presented. Process defects from each technology are examined to determine the fault models that best detect these defects. Commonalities and differences of fault models among the circuit types are described. The test cost required to obtain the same quality in each technology is described. It is shown that bipolar circuits can be effectively tested by the stuck fault model. To achieve high test coverage in CMOS circuits, stuck fault and current testing should be applied. Current testing can be effective in CMOS if the appropriate patterns are generated. BiCMOS requires delay testing. While current measurement could detect a few defects, it is not enough to replace delay test in BiCMOS. Delay testing may not detect all defects even if test vectors are available. Furthermore, it is expensive in test generation and test hardware cost. This suggests that design-for-test features may even be more important for BiCMOS circuits than for CMOS or bipolar circuits. >" @default.
- W1569555474 created "2016-06-24" @default.
- W1569555474 creator A5017159399 @default.
- W1569555474 creator A5040447762 @default.
- W1569555474 creator A5060731135 @default.
- W1569555474 creator A5086942324 @default.
- W1569555474 date "2002-12-09" @default.
- W1569555474 modified "2023-09-27" @default.
- W1569555474 title "Bipolar, CMOS and BiCMOS circuit technologies examined for testability" @default.
- W1569555474 cites W2012087965 @default.
- W1569555474 cites W2132064440 @default.
- W1569555474 cites W2134332340 @default.
- W1569555474 cites W57564191 @default.
- W1569555474 cites W2468449307 @default.
- W1569555474 doi "https://doi.org/10.1109/mwscas.1991.251963" @default.
- W1569555474 hasPublicationYear "2002" @default.
- W1569555474 type Work @default.
- W1569555474 sameAs 1569555474 @default.
- W1569555474 citedByCount "4" @default.
- W1569555474 crossrefType "proceedings-article" @default.
- W1569555474 hasAuthorship W1569555474A5017159399 @default.
- W1569555474 hasAuthorship W1569555474A5040447762 @default.
- W1569555474 hasAuthorship W1569555474A5060731135 @default.
- W1569555474 hasAuthorship W1569555474A5086942324 @default.
- W1569555474 hasConcept C119599485 @default.
- W1569555474 hasConcept C126953365 @default.
- W1569555474 hasConcept C127313418 @default.
- W1569555474 hasConcept C127413603 @default.
- W1569555474 hasConcept C134146338 @default.
- W1569555474 hasConcept C165205528 @default.
- W1569555474 hasConcept C165801399 @default.
- W1569555474 hasConcept C172385210 @default.
- W1569555474 hasConcept C175551986 @default.
- W1569555474 hasConcept C17626397 @default.
- W1569555474 hasConcept C190874656 @default.
- W1569555474 hasConcept C200601418 @default.
- W1569555474 hasConcept C24326235 @default.
- W1569555474 hasConcept C41008148 @default.
- W1569555474 hasConcept C46362747 @default.
- W1569555474 hasConcept C51234621 @default.
- W1569555474 hasConcept C62427370 @default.
- W1569555474 hasConceptScore W1569555474C119599485 @default.
- W1569555474 hasConceptScore W1569555474C126953365 @default.
- W1569555474 hasConceptScore W1569555474C127313418 @default.
- W1569555474 hasConceptScore W1569555474C127413603 @default.
- W1569555474 hasConceptScore W1569555474C134146338 @default.
- W1569555474 hasConceptScore W1569555474C165205528 @default.
- W1569555474 hasConceptScore W1569555474C165801399 @default.
- W1569555474 hasConceptScore W1569555474C172385210 @default.
- W1569555474 hasConceptScore W1569555474C175551986 @default.
- W1569555474 hasConceptScore W1569555474C17626397 @default.
- W1569555474 hasConceptScore W1569555474C190874656 @default.
- W1569555474 hasConceptScore W1569555474C200601418 @default.
- W1569555474 hasConceptScore W1569555474C24326235 @default.
- W1569555474 hasConceptScore W1569555474C41008148 @default.
- W1569555474 hasConceptScore W1569555474C46362747 @default.
- W1569555474 hasConceptScore W1569555474C51234621 @default.
- W1569555474 hasConceptScore W1569555474C62427370 @default.
- W1569555474 hasLocation W15695554741 @default.
- W1569555474 hasOpenAccess W1569555474 @default.
- W1569555474 hasPrimaryLocation W15695554741 @default.
- W1569555474 hasRelatedWork W1505584864 @default.
- W1569555474 hasRelatedWork W1544183489 @default.
- W1569555474 hasRelatedWork W1749453245 @default.
- W1569555474 hasRelatedWork W2008871958 @default.
- W1569555474 hasRelatedWork W2009570792 @default.
- W1569555474 hasRelatedWork W2040773997 @default.
- W1569555474 hasRelatedWork W2102986659 @default.
- W1569555474 hasRelatedWork W2103839382 @default.
- W1569555474 hasRelatedWork W2109100207 @default.
- W1569555474 hasRelatedWork W2111523147 @default.
- W1569555474 hasRelatedWork W2115913680 @default.
- W1569555474 hasRelatedWork W2116620167 @default.
- W1569555474 hasRelatedWork W2121833152 @default.
- W1569555474 hasRelatedWork W2124692568 @default.
- W1569555474 hasRelatedWork W2129795492 @default.
- W1569555474 hasRelatedWork W2136081556 @default.
- W1569555474 hasRelatedWork W2186523850 @default.
- W1569555474 hasRelatedWork W2490989994 @default.
- W1569555474 hasRelatedWork W2577882373 @default.
- W1569555474 hasRelatedWork W87289241 @default.
- W1569555474 isParatext "false" @default.
- W1569555474 isRetracted "false" @default.
- W1569555474 magId "1569555474" @default.
- W1569555474 workType "article" @default.