Matches in SemOpenAlex for { <https://semopenalex.org/work/W1570364327> ?p ?o ?g. }
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- W1570364327 endingPage "1838" @default.
- W1570364327 startingPage "1834" @default.
- W1570364327 abstract "The paper presents the results of an investigation of the proton tolerance of the multiple-threshold voltage and multiple-breakdown voltage device design points contained in a 0.18 /spl mu/m system-on-a-chip CMOS technology. The radiation response of the CMOS devices having three different device design configurations are characterized and compared for equivalent gamma doses up to 300 krad(Si), using the threshold voltage, off-state leakage, and effective mobility to assess the dc performance. All three CMOS device configurations show a very slight degradation of threshold voltage and effective mobility with increasing dose. We also present for the first time the frequency response and S-parameters of these RF CMOS devices under proton radiation. The S-parameters and cut-off frequency show little degradation up to 300 krad(Si) total dose. These results suggest that the CMOS devices in this 0.18 /spl mu/m SoC CMOS technology are well-suited for RF circuit applications in an ionizing radiation environment without intentional total-dose hardening." @default.
- W1570364327 created "2016-06-24" @default.
- W1570364327 creator A5024676367 @default.
- W1570364327 creator A5028795525 @default.
- W1570364327 creator A5032868473 @default.
- W1570364327 creator A5039213935 @default.
- W1570364327 creator A5042209105 @default.
- W1570364327 creator A5073899315 @default.
- W1570364327 creator A5076089467 @default.
- W1570364327 creator A5076432479 @default.
- W1570364327 creator A5083591096 @default.
- W1570364327 creator A5084413983 @default.
- W1570364327 date "2003-12-01" @default.
- W1570364327 modified "2023-09-26" @default.
- W1570364327 title "Proton tolerance of multiple-threshold voltage and multiple-breakdown voltage CMOS device design points in a 0.18 /spl mu/m system-on-a-chip CMOS technology" @default.
- W1570364327 cites W2035868007 @default.
- W1570364327 cites W2117193933 @default.
- W1570364327 cites W2123423610 @default.
- W1570364327 cites W2140945954 @default.
- W1570364327 cites W2161199313 @default.
- W1570364327 cites W2168120726 @default.
- W1570364327 doi "https://doi.org/10.1109/tns.2003.821800" @default.
- W1570364327 hasPublicationYear "2003" @default.
- W1570364327 type Work @default.
- W1570364327 sameAs 1570364327 @default.
- W1570364327 citedByCount "16" @default.
- W1570364327 countsByYear W15703643272012 @default.
- W1570364327 countsByYear W15703643272014 @default.
- W1570364327 countsByYear W15703643272020 @default.
- W1570364327 crossrefType "journal-article" @default.
- W1570364327 hasAuthorship W1570364327A5024676367 @default.
- W1570364327 hasAuthorship W1570364327A5028795525 @default.
- W1570364327 hasAuthorship W1570364327A5032868473 @default.
- W1570364327 hasAuthorship W1570364327A5039213935 @default.
- W1570364327 hasAuthorship W1570364327A5042209105 @default.
- W1570364327 hasAuthorship W1570364327A5073899315 @default.
- W1570364327 hasAuthorship W1570364327A5076089467 @default.
- W1570364327 hasAuthorship W1570364327A5076432479 @default.
- W1570364327 hasAuthorship W1570364327A5083591096 @default.
- W1570364327 hasAuthorship W1570364327A5084413983 @default.
- W1570364327 hasConcept C119349744 @default.
- W1570364327 hasConcept C119599485 @default.
- W1570364327 hasConcept C120665830 @default.
- W1570364327 hasConcept C121332964 @default.
- W1570364327 hasConcept C127413603 @default.
- W1570364327 hasConcept C139719470 @default.
- W1570364327 hasConcept C153385146 @default.
- W1570364327 hasConcept C162324750 @default.
- W1570364327 hasConcept C165005293 @default.
- W1570364327 hasConcept C165801399 @default.
- W1570364327 hasConcept C172385210 @default.
- W1570364327 hasConcept C192562407 @default.
- W1570364327 hasConcept C195370968 @default.
- W1570364327 hasConcept C24326235 @default.
- W1570364327 hasConcept C2777042071 @default.
- W1570364327 hasConcept C46362747 @default.
- W1570364327 hasConcept C49040817 @default.
- W1570364327 hasConceptScore W1570364327C119349744 @default.
- W1570364327 hasConceptScore W1570364327C119599485 @default.
- W1570364327 hasConceptScore W1570364327C120665830 @default.
- W1570364327 hasConceptScore W1570364327C121332964 @default.
- W1570364327 hasConceptScore W1570364327C127413603 @default.
- W1570364327 hasConceptScore W1570364327C139719470 @default.
- W1570364327 hasConceptScore W1570364327C153385146 @default.
- W1570364327 hasConceptScore W1570364327C162324750 @default.
- W1570364327 hasConceptScore W1570364327C165005293 @default.
- W1570364327 hasConceptScore W1570364327C165801399 @default.
- W1570364327 hasConceptScore W1570364327C172385210 @default.
- W1570364327 hasConceptScore W1570364327C192562407 @default.
- W1570364327 hasConceptScore W1570364327C195370968 @default.
- W1570364327 hasConceptScore W1570364327C24326235 @default.
- W1570364327 hasConceptScore W1570364327C2777042071 @default.
- W1570364327 hasConceptScore W1570364327C46362747 @default.
- W1570364327 hasConceptScore W1570364327C49040817 @default.
- W1570364327 hasIssue "6" @default.
- W1570364327 hasLocation W15703643271 @default.
- W1570364327 hasOpenAccess W1570364327 @default.
- W1570364327 hasPrimaryLocation W15703643271 @default.
- W1570364327 hasRelatedWork W1561253851 @default.
- W1570364327 hasRelatedWork W2104135808 @default.
- W1570364327 hasRelatedWork W2119866965 @default.
- W1570364327 hasRelatedWork W2120697813 @default.
- W1570364327 hasRelatedWork W2139774918 @default.
- W1570364327 hasRelatedWork W2152101054 @default.
- W1570364327 hasRelatedWork W2588653446 @default.
- W1570364327 hasRelatedWork W2956315369 @default.
- W1570364327 hasRelatedWork W3100668214 @default.
- W1570364327 hasRelatedWork W3127857378 @default.
- W1570364327 hasVolume "50" @default.
- W1570364327 isParatext "false" @default.
- W1570364327 isRetracted "false" @default.
- W1570364327 magId "1570364327" @default.
- W1570364327 workType "article" @default.