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- W1574927748 abstract "The use of photon emission for analyzing failure mechanisms and defects in CMOS ICs is presented. Techniques are given for accurate identification and spatial localization of failure mechanisms and physical defects, including defects such as short and open circuits which do not themselves emit photons." @default.
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- W1574927748 date "1990-01-01" @default.
- W1574927748 modified "2023-10-04" @default.
- W1574927748 title "The use of light emission in failure analysis of CMOS ICs" @default.
- W1574927748 hasPublicationYear "1990" @default.
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