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- W1575197907 abstract "As semiconductor devices shrink in size, it becomes more important to characterize and understand electronic properties of the materials and devices at the nanoscale. Scanning probe techniques offers numerous advantages over traditional tools used for semiconductor materials and devices characterization including high spatial resolution, ease of use and multi-functionality for electrical characterization, such as current, potential and capacitance, etc. In the first chapter, the basic principle of atomic force microscopy (AFM), and its application to characterization of semiconductor materials and devices are discussed. In the second part of the thesis, scanning capacitance microscopy (SCM), spectroscopy (SCS) and scanning Kelvin probe microscopy (SKPM) are used to investigate the structure and electronic properties of nitride based materials and devices, specifically doping in p-type GaN and electronic structure and morphology of InxGa1-xN/GaN quantum wells. In this work, AFM is used to characterize the local electronic structure in nitride thin film and heterostructures devices. In next part the thesis, AFM is used as an active part of the device, in conductive atomic force microscopy (C-AFM) and scanning gate microscopy (SGM), to study the transport properties and gating effect of InAs semiconductor nanowire based field effect transistor. This is made possible because the nanowire, as a potential one-dimension building block for high performance electronics and optoelectronics, has a diameter comparable to the size of AFM tips. In the last part of the thesis (appendix), SKPM is used to characterize semiconductor-like organic thin films, where measurements of the potential profile along the channel of an organic thin film transistor (OTFT) at different gate bias are presented to illustrate the unique transport property of such devices" @default.
- W1575197907 created "2016-06-24" @default.
- W1575197907 creator A5035955529 @default.
- W1575197907 date "2007-01-01" @default.
- W1575197907 modified "2023-09-24" @default.
- W1575197907 title "Scanning probe characterization of novel semiconductor materials and devices" @default.
- W1575197907 hasPublicationYear "2007" @default.
- W1575197907 type Work @default.
- W1575197907 sameAs 1575197907 @default.
- W1575197907 citedByCount "0" @default.
- W1575197907 crossrefType "journal-article" @default.
- W1575197907 hasAuthorship W1575197907A5035955529 @default.
- W1575197907 hasConcept C102951782 @default.
- W1575197907 hasConcept C108225325 @default.
- W1575197907 hasConcept C158457848 @default.
- W1575197907 hasConcept C159985019 @default.
- W1575197907 hasConcept C171250308 @default.
- W1575197907 hasConcept C187921700 @default.
- W1575197907 hasConcept C192562407 @default.
- W1575197907 hasConcept C206008964 @default.
- W1575197907 hasConcept C26771246 @default.
- W1575197907 hasConcept C2779227376 @default.
- W1575197907 hasConcept C2780841128 @default.
- W1575197907 hasConcept C36628996 @default.
- W1575197907 hasConcept C49040817 @default.
- W1575197907 hasConcept C74214498 @default.
- W1575197907 hasConcept C79635011 @default.
- W1575197907 hasConcept C79794668 @default.
- W1575197907 hasConcept C83898325 @default.
- W1575197907 hasConcept C99752389 @default.
- W1575197907 hasConceptScore W1575197907C102951782 @default.
- W1575197907 hasConceptScore W1575197907C108225325 @default.
- W1575197907 hasConceptScore W1575197907C158457848 @default.
- W1575197907 hasConceptScore W1575197907C159985019 @default.
- W1575197907 hasConceptScore W1575197907C171250308 @default.
- W1575197907 hasConceptScore W1575197907C187921700 @default.
- W1575197907 hasConceptScore W1575197907C192562407 @default.
- W1575197907 hasConceptScore W1575197907C206008964 @default.
- W1575197907 hasConceptScore W1575197907C26771246 @default.
- W1575197907 hasConceptScore W1575197907C2779227376 @default.
- W1575197907 hasConceptScore W1575197907C2780841128 @default.
- W1575197907 hasConceptScore W1575197907C36628996 @default.
- W1575197907 hasConceptScore W1575197907C49040817 @default.
- W1575197907 hasConceptScore W1575197907C74214498 @default.
- W1575197907 hasConceptScore W1575197907C79635011 @default.
- W1575197907 hasConceptScore W1575197907C79794668 @default.
- W1575197907 hasConceptScore W1575197907C83898325 @default.
- W1575197907 hasConceptScore W1575197907C99752389 @default.
- W1575197907 hasLocation W15751979071 @default.
- W1575197907 hasOpenAccess W1575197907 @default.
- W1575197907 hasPrimaryLocation W15751979071 @default.
- W1575197907 hasRelatedWork W1550701704 @default.
- W1575197907 hasRelatedWork W1621387237 @default.
- W1575197907 hasRelatedWork W1695599999 @default.
- W1575197907 hasRelatedWork W1970591037 @default.
- W1575197907 hasRelatedWork W1978001166 @default.
- W1575197907 hasRelatedWork W1992034422 @default.
- W1575197907 hasRelatedWork W1992160371 @default.
- W1575197907 hasRelatedWork W2019126243 @default.
- W1575197907 hasRelatedWork W2024610046 @default.
- W1575197907 hasRelatedWork W2024671047 @default.
- W1575197907 hasRelatedWork W2025798218 @default.
- W1575197907 hasRelatedWork W2036140682 @default.
- W1575197907 hasRelatedWork W2037940023 @default.
- W1575197907 hasRelatedWork W2057266752 @default.
- W1575197907 hasRelatedWork W2092725625 @default.
- W1575197907 hasRelatedWork W2124726983 @default.
- W1575197907 hasRelatedWork W2393592055 @default.
- W1575197907 hasRelatedWork W2401358009 @default.
- W1575197907 hasRelatedWork W2890904341 @default.
- W1575197907 hasRelatedWork W3024652332 @default.
- W1575197907 isParatext "false" @default.
- W1575197907 isRetracted "false" @default.
- W1575197907 magId "1575197907" @default.
- W1575197907 workType "article" @default.