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- W1580893272 abstract "A simple macro-model to accurately simulate upset error on CMOS devices is presented. This macro-model can accurately simulate the typical behavior of single event effect (SEE) caused by ionizing radiation charge collection at N type and P type diffusions. The model is calibrated using 3-D mixed mode technology computer aided design (TCAD) device simulations and implemented as a SPICE circuit macro-model. The model uses a dependent current source with a Weibull distribution to model the current injection on circuit node. The model shows physical response and adjusting parameters allows high accuracy to the 3-D TCAD simulated response." @default.
- W1580893272 created "2016-06-24" @default.
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- W1580893272 date "2015-05-01" @default.
- W1580893272 modified "2023-09-25" @default.
- W1580893272 title "Simple and accurate single event charge collection macro modeling for circuit simulation" @default.
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- W1580893272 doi "https://doi.org/10.1109/iscas.2015.7169019" @default.
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