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- W1583563497 abstract "An unresolved issue in IC testing is what mix of coverages of different types of test is required in order to achieve a given quality goal. This paper investigates the interaction between IDDQ and stuck-at coverage and examines the use of IDDQ to increase effective stuck-at coverage, particularly in situations where the graded coverage is lower than the desired goal. Empirical data is presented which examines the extent to which a varying number of IDDQ tests can detect parts which would fail stuck-at tests. This leads to development of a composite metric, based on stuck-at coverage, which allows a tradeoff to be made between adding further logic tests and adding IDDQ tests." @default.
- W1583563497 created "2016-06-24" @default.
- W1583563497 creator A5049945243 @default.
- W1583563497 date "2002-11-19" @default.
- W1583563497 modified "2023-09-23" @default.
- W1583563497 title "The use of IDDQ testing in low stuck-at coverage situations" @default.
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- W1583563497 doi "https://doi.org/10.1109/vtest.1995.512621" @default.
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