Matches in SemOpenAlex for { <https://semopenalex.org/work/W158448112> ?p ?o ?g. }
Showing items 1 to 52 of
52
with 100 items per page.
- W158448112 abstract "In this thesis, optimal and near-optimal algorithms are developed for various classes of single fault test-sequencing algorithms. We first present a novel multi-signal modeling methodology that alleviates some of the model validation problems of traditional dependency modeling, while achieving the same diagnostic resolution. We discuss the failure probability estimation and reachability analysis algorithms for dependency and multi-signal models. We also present efficient static analysis algorithms to rapidly evaluate topological testability deficiencies of a system based on the results of reachability analysis and directed graph processing, including the determination of ambiguity groups of faults, redundant tests, hidden and masking false failure sets.Next, we present an array of optimal and near-optimal test-sequencing algorithms that incorporate real-world testing features such as precedence constraints on tests, setup operations for tests, and traveling costs for tests. We develop efficient implementation techniques to speed up the test sequencing algorithms, including bit-compacted representation of the fault dictionary (D-matrix) and a fast, efficient, in-place transposition algorithm for the compacted D-matrix. The algorithms have been used for developing diagnostic strategies for systems having 50,000 failures and 50,000 test points.We extend these algorithms to the case of imperfect tests, where tests have false alarms and missed detections. Specifically, we develop a dynamic programming formulation for the problem of imperfect test sequencing and obtain closed form solutions for systems of special structure. We present practical test sequencing algorithms based on Information Gain and Certainty Equivalence, and compare them with the optimal DP method for small systems. We also present top-down graph search techniques which enabled us to construct static diagnostic strategies for large systems (up to 2000 faults and 2000 unreliable tests). Finally, we consider the various test sequencing problems that arise in the Design for Testability including Minimax test sequencing, test sequencing with a constraint on the expected testing time, test sequencing with a constraint on the number of tests used, and minimal storage test sequencing, for which we derive optimal and near-optimal top-down graph search solution algorithms." @default.
- W158448112 created "2016-06-24" @default.
- W158448112 creator A5004620125 @default.
- W158448112 date "1996-01-01" @default.
- W158448112 modified "2023-09-28" @default.
- W158448112 title "Algorithms for sequential fault diagnosis" @default.
- W158448112 hasPublicationYear "1996" @default.
- W158448112 type Work @default.
- W158448112 sameAs 158448112 @default.
- W158448112 citedByCount "3" @default.
- W158448112 countsByYear W1584481122017 @default.
- W158448112 crossrefType "journal-article" @default.
- W158448112 hasAuthorship W158448112A5004620125 @default.
- W158448112 hasConcept C11413529 @default.
- W158448112 hasConcept C136643341 @default.
- W158448112 hasConcept C152745839 @default.
- W158448112 hasConcept C154945302 @default.
- W158448112 hasConcept C172707124 @default.
- W158448112 hasConcept C41008148 @default.
- W158448112 hasConceptScore W158448112C11413529 @default.
- W158448112 hasConceptScore W158448112C136643341 @default.
- W158448112 hasConceptScore W158448112C152745839 @default.
- W158448112 hasConceptScore W158448112C154945302 @default.
- W158448112 hasConceptScore W158448112C172707124 @default.
- W158448112 hasConceptScore W158448112C41008148 @default.
- W158448112 hasLocation W1584481121 @default.
- W158448112 hasOpenAccess W158448112 @default.
- W158448112 hasPrimaryLocation W1584481121 @default.
- W158448112 hasRelatedWork W1589387944 @default.
- W158448112 hasRelatedWork W1985925539 @default.
- W158448112 hasRelatedWork W2027160389 @default.
- W158448112 hasRelatedWork W2046211462 @default.
- W158448112 hasRelatedWork W2047961819 @default.
- W158448112 hasRelatedWork W2097928645 @default.
- W158448112 hasRelatedWork W2110414292 @default.
- W158448112 hasRelatedWork W2111480166 @default.
- W158448112 hasRelatedWork W2135323599 @default.
- W158448112 hasRelatedWork W2135425730 @default.
- W158448112 hasRelatedWork W2144641128 @default.
- W158448112 hasRelatedWork W2152633841 @default.
- W158448112 hasRelatedWork W2154025936 @default.
- W158448112 hasRelatedWork W2170923027 @default.
- W158448112 hasRelatedWork W2379232830 @default.
- W158448112 hasRelatedWork W2383096686 @default.
- W158448112 hasRelatedWork W2413785658 @default.
- W158448112 hasRelatedWork W2535820831 @default.
- W158448112 hasRelatedWork W2901291583 @default.
- W158448112 hasRelatedWork W2914307513 @default.
- W158448112 isParatext "false" @default.
- W158448112 isRetracted "false" @default.
- W158448112 magId "158448112" @default.
- W158448112 workType "article" @default.