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• W1585873792 abstract "Emission spectra of avalanching n(+)p junctions manufactured in a standard CMOS technology with no process modifications were measured over a broad photon energy spectrum ranging from 0.8 eV to 2.8 eV at various temperatures. The temperature coefficients of the emission rates at different photon energies were determined. Below a photon energy of 1.35 eV the temperature coefficient of emission was positive, and above 1.35 eV the temperature coefficient was negative. Two narrowband emissions were also identified from the temperature characterization, namely an enhanced positive temperature coefficient at 1.15 eV photon energy, and an enhanced negative temperature coefficient at 2.0 eV. Device simulations and Monte Carlo simulations were used to interpret the results." @default.
• W1585873792 created "2016-06-24" @default.
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• W1585873792 date "2015-05-05" @default.
• W1585873792 modified "2023-09-27" @default.
• W1585873792 title "Temperature characteristics of hot electron electroluminescence in silicon" @default.
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• W1585873792 doi "https://doi.org/10.1364/oe.23.012605" @default.
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