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- W1586580736 abstract "This chapter describes the basic concepts of magnetic resonance and some of the principal interaction terms revealed in the electron paramagnetic resonance (EPR) and electron-nuclear double-resonance (ENDOR) spectra. Several examples are cited in the chapter to illustrate how each of these shows up in the spectra and how, in turn, they can be used to reveal the microscopic structure of a defect. EPR and ENDOR can be extremely powerful experimental tools for the study of point defects in semiconductors. Their magnetic resonance spectra, properly interpreted, often contain highly detailed microscopic information about the structure of a defect, which cannot be obtained in any other way. In an EPR experiment, the sample is placed in a magnetic field and transitions are induced between the Zeeman levels of the defect. Either dispersion or absorption can be studied by adjusting the phase of the reference signal derived directly from the microwave source." @default.
- W1586580736 created "2016-06-24" @default.
- W1586580736 creator A5021951883 @default.
- W1586580736 date "1998-01-01" @default.
- W1586580736 modified "2023-10-14" @default.
- W1586580736 title "Chapter 1 EPR and ENDOR Studies of Defects in Semiconductors" @default.
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- W1586580736 doi "https://doi.org/10.1016/s0080-8784(08)63053-7" @default.
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