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- W1590455533 abstract "A new method is described which allows determination of Ton and Toff delays of logic gates on VLSI chips as function of load by frequency measurements, that means with automatic testsystems and computer aided evaluation." @default.
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- W1590455533 date "1982-09-01" @default.
- W1590455533 modified "2023-10-03" @default.
- W1590455533 title "A New Method for Improved Delay Characterization of VLSI Logic" @default.
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