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- W1591488896 endingPage "246" @default.
- W1591488896 startingPage "109" @default.
- W1591488896 abstract "This chapter describes the failure mechanisms (FMs) identified by failure analysis (FA). First, those FMs that are more or less common to all electronic component technologies are detailed, grouped around the process steps where the specific failure risk might be initiated. Then, for each main technology for manufacturing electronic components, the typical FMs are detailed, which are directly related to the applications of the given family of electronic components. Passive components, such as resistors, capacitors, inductors, transducers, switches, relays, connectors, and fuses, outnumber semiconductor devices in most electronic equipment. The chapter also describes the FMs of the Bi technologies and presents a list FMs of the metal-oxide semiconductor (MOS) technologies. The typical FMs of optoelectronic and photonic components are detailed in the chapter. Controlled Vocabulary Terms failure analysis; MIS devices; optoelectronic devices" @default.
- W1591488896 created "2016-06-24" @default.
- W1591488896 creator A5033625534 @default.
- W1591488896 creator A5078252862 @default.
- W1591488896 date "2011-04-15" @default.
- W1591488896 modified "2023-10-18" @default.
- W1591488896 title "Failure Analysis – What?" @default.
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