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- W1596803670 abstract "Critical Area (CA) analysis can be applied to the prediction of post-fabrication reliability of integrated circuits. However, the accuracy of the prediction is dependent on the validity of the chosen defect model. A comparison, highlighting the importance of this selection, is made between the results obtained using two differently shaped models. In conclusion, a novel CA analysis technique is outlined, which provides both quick and accurate computation of layout CA." @default.
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- W1596803670 date "2002-11-19" @default.
- W1596803670 modified "2023-09-26" @default.
- W1596803670 title "Reliability prediction through critical area analysis" @default.
- W1596803670 doi "https://doi.org/10.1109/irws.1995.493604" @default.
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