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- W1605431583 abstract "A characterization of the graphitic overlayer that forms on 4H–SiC(0001¯) substrates heated for ten minutes to temperatures T > 1350 °C under vacuum conditions has been performed. X-ray photoelectron spectroscopy of the C-face reveals the presence of graphitic carbon with a thickness that increases with growth temperature. Parallel atomic force microscope (AFM) studies find a mesh-like network of ridges with high curvature that bound atomically flat, tile-like facets of few-layer graphene (FLG). By imaging the network that develops on FLG, it is possible to map out the regions where the elastic energy is concentrated." @default.
- W1605431583 created "2016-06-24" @default.
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- W1605431583 date "2010-08-01" @default.
- W1605431583 modified "2023-09-27" @default.
- W1605431583 title "AFM study of ridges in few-layer epitaxial graphene grown on the carbon-face of 4H–SiC" @default.
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- W1605431583 doi "https://doi.org/10.1016/j.carbon.2010.02.026" @default.
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