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- W1608692246 abstract "Characteristics of soft errors (SEs) in 90/130 nm CMOS circuits were comprehensively investigated by high energy neutron- and alpha-accelerated tests. Process dependence on SEs in latch circuits due to neutrons and alpha-ray were investigated. Error patterns in multiple-bit SEs in SRAMs and their impacts on ECC design were also discussed." @default.
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- W1608692246 date "2005-04-19" @default.
- W1608692246 modified "2023-09-27" @default.
- W1608692246 title "Comprehensive study of soft errors in advanced CMOS circuits with 90/130 nm technology" @default.
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- W1608692246 doi "https://doi.org/10.1109/iedm.2004.1419339" @default.
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