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- W1616354768 abstract "Detailed optical scanning of tray clamps is being conducted in the Facility for the Optical Inspection of Large Surfaces at JSC to locate and document impacts as small as 40 microns in diameter. Residues from selected impacts are then being characterized by Scanning Electron Microscopy/Energy Dispersive X-ray Analysis at CNES. Results from this analysis will be the initial step to classifying projectile residues into specific sources." @default.
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- W1616354768 date "1992-06-01" @default.
- W1616354768 modified "2023-09-27" @default.
- W1616354768 title "Scanning electron microscope/energy dispersive x ray analysis of impact residues on LDEF tray clamps" @default.
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