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- W1621392192 abstract "It is shown how standard ..delta..Vth and mobility measurements made on otherwise identical n- and p-channel transistors can be combined to accurately estimate radiation-induced ..delta..V/sub ot/ and ..delta..V/sub it/. Applications of the method are described. 12 refs., 2 figs." @default.
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- W1621392192 date "1989-01-01" @default.
- W1621392192 modified "2023-09-27" @default.
- W1621392192 title "Dual-transistor method to determine. delta. V/sub ot/ and. delta. V/sub it/ for MOS devices" @default.
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