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• W1638006504 abstract "In situ annealed high temperature superconducting YBa 2 Cu 3 O 7-δ thin films have been deposited on an MgO (100) substrate from a single stoichiometric target using DC magnetron sputtering. The films were characterized by X-Ray diffraction (XRD) and scanning electron microscopy (SEM) techniques. The effect of varying substrate temperature, T s , and O 2 /Ar ratio on lattice parameters and on the degree of orientation of the films were examined. Both c - and a -lattice parameters decreased with increasing T s . The reduction of c and a -lattice parameters as well as the oxygen deficiency in the films, δ, obey general ( T s - T 0 ) -4 behavior. We develope a new method to measure a more accurate way to find the degree of preferrential orientation along c and a -axis of the deposited films, (Δ V 006 /Δ V 200 ), at different T s by using X-ray diffraction theory and JCPDS files to obtain ∣ F (006) / F (200) ∣ 2 . At T s =735°C, the volume fraction along the c -axis was found to be Δ V c ≈5.5 ×Δ V a corresponding to 85 grains having preferred orientation along c -axis. In addition, we have also measured FWHM of the (006) and (200) peaks by varying T s . The thickness of the grains were estimated at different substrate temperature using the Scherrer formula." @default.
• W1638006504 created "2016-06-24" @default.
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• W1638006504 date "1995-11-01" @default.
• W1638006504 modified "2023-09-25" @default.
• W1638006504 title "Comprehensive X-Ray Diffraction Study of YBa₂Cu₃O_7-δ Thin Films" @default.
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• W1638006504 doi "https://doi.org/10.1143/jjap.34.6036" @default.
• W1638006504 hasPublicationYear "1995" @default.
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