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- W1638137839 abstract "We present a simulation-based approach for characterizing hot-carrier degradation in SOI MOSFETs, which includes models for hot-carrier injection, carrier transport, and carrier trapping in the gate oxide. This approach clearly illustrates the physical mechanisms responsible for hot-carrier degradation in SOI MOSFETs. To suppress the hot-carrier effect, we have also proposed the SOI LDDMOSFET structure and the simulation results have been compared with each other." @default.
- W1638137839 created "2016-06-24" @default.
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- W1638137839 date "2004-06-30" @default.
- W1638137839 modified "2023-09-24" @default.
- W1638137839 title "Numerical simulation of hot-carrier degradation in SOI MOSFETs" @default.
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- W1638137839 doi "https://doi.org/10.1109/iwjt.2004.1306855" @default.
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