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• W1640557961 abstract "Electrical switching investigations and supportive thermal studies have been undertaken on semiconducting chalcogenide GexSe35−xTe65 (18≤x≤25) glasses prepared in bulk form. An interesting composition dependent change (memory to threshold) has been observed in the switching behavior of these glasses across the stiffness/rigidity percolation threshold (RPT) at x=20 (〈r〉=2.40). Also, the rigid GexSe35−xTe65 glasses are found to retain the threshold behavior for hundreds of switching cycles. Further, the switching voltage of GexSe35−xTe65 glasses has been found to exhibit an abrupt increase at the RPT. Alternating Differential Scanning Calorimetric studies indicate that the GexSe35−xTe65 glasses with higher tellurium concentrations exhibit two crystallization exotherms, which coalesce at the composition x=20.5 (average coordination 〈r〉=2.41), which also marks the beginning of melting endotherms. The relatively low crystallization temperature (Tc1), along with the floppy structural network aids easy phase change in GexSe35−xTe65 glasses with x<20, causing them to exhibit memory switching. The moderately higher crystallization temperature (300–330 ∘C) and the stabilizing influence of network connectivity & rigidity are plausibly responsible for the threshold behavior seen in the rigid GexSe35−xTe65 glasses." @default.
• W1640557961 created "2016-06-24" @default.
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• W1640557961 date "2008-09-01" @default.
• W1640557961 modified "2023-09-26" @default.
• W1640557961 title "Composition dependent electrical switching in glasses–the influence of network rigidity and thermal properties" @default.
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• W1640557961 doi "https://doi.org/10.1016/j.ssc.2008.07.005" @default.
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