Matches in SemOpenAlex for { <https://semopenalex.org/work/W1649678033> ?p ?o ?g. }
- W1649678033 endingPage "359" @default.
- W1649678033 startingPage "275" @default.
- W1649678033 abstract "Several nuclear techniques have been developed for the study of lattice defects. Most of these methods, such as positron annihilation, hyperfine interactions (Mössbauer effect and perturbed angular correlation), nuclear magnetic resonance, and muon-spin precession as well as other methods, such as electrical resistivity and electron paramagnetic resonance, are used to probe the electronic environment of the nuclei, rather than the actual positions of the atoms in the lattice. However, an important characteristic of lattice defects is that they produce a localized spatial rearrangement of lattice atoms. The technique of ion channeling is especially suited to studying these displacements of lattice atoms in the vicinity of lattice defects. Ion channeling is the steering of a beam of energetic ions into the open spaces (channels) between close-packed rows or planes of atoms in a crystal. The use of ion channeling to study lattice defects in solids is based on the ability of channeled ions to see displacements of atoms from lattice sites. The various lattice defects are characterized by the type of displacement produced by them. Lattice defects can be classified according to their dimension in point defects, line defects, planar defects, and volume defects. Channeling also provides a useful analytical technique for characterizing crystal surfaces; when used in conjunction with low-energy electron diffraction (LEED), Auger spectroscopy, and nuclear microanalysis, it permits an accurate picture of various surface structures to be determined." @default.
- W1649678033 created "2016-06-24" @default.
- W1649678033 creator A5011172022 @default.
- W1649678033 creator A5016853788 @default.
- W1649678033 creator A5081205887 @default.
- W1649678033 date "1983-01-01" @default.
- W1649678033 modified "2023-09-25" @default.
- W1649678033 title "4.2. Channeling Studies of Lattice Defects" @default.
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