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• W1650049144 abstract "This paper deals with simulation and genetic algorithm (GA) based test generation for sequential circuits. We proposed a new sequential depth measure called sequential element reachability, which may be used as one of the parameters of the GA. For fitness functions, we propose a new dynamic testability measure, which can be evaluated in parallel for multiple individuals. The test generation is divided to three sub-problems: initialization, test vector generation for a group of faults and test sequence generation for a target fault. Using ISCAS89 benchmarks, experimental results for the GA are given." @default.
• W1650049144 created "2016-06-24" @default.
• W1650049144 creator A5077324106 @default.
• W1650049144 date "2003-01-20" @default.
• W1650049144 modified "2023-09-25" @default.
• W1650049144 title "Genetic algorithm based test generation for sequential circuits" @default.
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• W1650049144 doi "https://doi.org/10.1109/ats.1999.810748" @default.
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