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- W1659519290 abstract "Abstract : From the viewpoint of LSI/VLSI product-test preparation, simulation, at least a good circuit (fault-free) simulation, has become an absolute necessity simply because there can be no assurance that a design is structurally or functionally fault-free. Hence, as the system becomes more complex, and more parameters interact, then simulation is used to study relationships between the parameters. This report provides rules for relating commercially available fault simulators to a common baseline for calculation of fault coverage. It is known that drastic differences in fault coverage can be obtained from different commercial simulators, yet each bases its calculations on a justifiable and consistent set of rules. The objective of this study was to develop a baseline method of fault simulation and associated rules such that essentially identical results can be obtained by using any commercial simulator product. Four simulators were initially chosen to help develop these guidelines; no simulator among these four is to be considered better than any other. The results of this study have already been put into practice in the form draft MIL-STD-883 Test Method 5012, 'Fault Coverage Measurement Digital Microcircuits. (edc)" @default.
- W1659519290 created "2016-06-24" @default.
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- W1659519290 date "1989-11-01" @default.
- W1659519290 modified "2023-09-23" @default.
- W1659519290 title "Fault Simulator Evaluation" @default.
- W1659519290 hasPublicationYear "1989" @default.
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