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- W1661969618 abstract "using the van der Pauw technique, and grain boundary density was measured using quantitative microscopy technique. Mobility was found to decrease with increasing grain boundary density." @default.
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- W1661969618 date "1982-04-01" @default.
- W1661969618 modified "2023-10-17" @default.
- W1661969618 title "Analysis of Defect Structure in Silicon. Silicon Sheet Growth Development for the Large Area Silicon Sheet Task of the Low-Cost Solar Array Project" @default.
- W1661969618 doi "https://doi.org/10.2172/12206368" @default.
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