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- W1666078633 abstract "A new form of microscopy has been developed which produces micron- resolution maps of where single event upsets occur during ion irradiation of integrated circuits. utilizing a nuclear microprobe, this imaging technique can irradiate, in isolation, the lowest functional units of an integrated circuit (e.g. transistor drains, gates, feedback resistors) and measure immediately the effect of a high energy ion strike on circuit performance. Such detailed circuit characterization can provide heretofore inaccessible information to the designers of integrated circuits that are to be used in space or other radiation environments. 5 refs., 6 figs." @default.
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- W1666078633 date "1991-06-20" @default.
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- W1666078633 title "Application of the nuclear microprobe to the imaging of single event upsets in integrated circuits" @default.
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