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• W1667617467 abstract "Noise measurements on high quality devices can be hampered by the unavoidable noise added by the instrument performing the measurement. The paper will briefly discuss the reduction of the instrumental noise achievable by the cross-correlation technique and by the design of custom CMOS amplifiers. Practical applications in the case of nanofiber organic field-effect-transistors and of cryogenic noise measurements are also commented." @default.
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• W1667617467 date "2015-06-01" @default.
• W1667617467 modified "2023-09-23" @default.
• W1667617467 title "High sensitivity noise measurements: Circuits, techniques and applications" @default.
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• W1667617467 doi "https://doi.org/10.1109/icnf.2015.7288556" @default.
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