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- W1667843264 abstract "This paper presents a notation for describing functional fault models, which may occur in memory devices. Using this notation, the space of all possible memory faults has been constructed. It has been shown that this space is infinite, and contains the currently established fault models. New fault models in this space have been identified and verified using resistive and capacitive defect injection and simulation of a DRAM model." @default.
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- W1667843264 date "2002-11-07" @default.
- W1667843264 modified "2023-10-05" @default.
- W1667843264 title "Functional memory faults: a formal notation and a taxonomy" @default.
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- W1667843264 doi "https://doi.org/10.1109/vtest.2000.843856" @default.
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