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- W1677567510 abstract "Abstract We examined temperature dependence of the I c R n ( I c being the critical current and R n being the normal-state resistance) product for interface-engineered YBa 2 Cu 3 O 7− x ramp-edge junctions formed on a groundplane. There were two types for the temperature dependence of the I c R n product. One was the linear temperature dependence, and the other was a dependence that shows the steeper drop with temperature. There were two factors that were responsible for the temperature dependence of the I c R n value. These were critical temperature T c of the junctions and temperature dependence of the R n value. The I c R n value more than 1 mV at 40 K was obtained for the junction that had the T c of 84 K and the positive coefficient of R n value on temperature." @default.
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- W1677567510 date "2006-10-01" @default.
- W1677567510 modified "2023-09-27" @default.
- W1677567510 title "IcRn product of YBa2Cu3O7−x ramp-edge junctions at temperatures higher than 30K" @default.
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- W1677567510 doi "https://doi.org/10.1016/j.physc.2006.05.068" @default.
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