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- W1713162318 abstract "System chips are increasingly being designed by embedding reusable pre-designed and pre-verified cores. Modular, core-based test development is an attractive proposition for such large and complex ICs. This paper outlines the approach developed and used in Philips for core-based testing. It consists of four components: (1) a standardized set of test deliverables for a core, (2) standardized on-chip test access hardware, (3) a tool for translation of core tests into SOC tests, and (4) a tool for test scheduling." @default.
- W1713162318 created "2016-06-24" @default.
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- W1713162318 date "2002-01-01" @default.
- W1713162318 modified "2023-09-25" @default.
- W1713162318 title "An Industrial Approach to Core-Based System Chip Testing" @default.
- W1713162318 cites W1979324833 @default.
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- W1713162318 doi "https://doi.org/10.1007/978-0-387-35597-9_33" @default.
- W1713162318 hasPublicationYear "2002" @default.
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