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• W1749479531 abstract "In order to understand ferromagnetic ordering in SiC-based diluted magnetic semiconductors, Fe-implanted 6H-SiC subsequently annealed was studied by Atom Probe Tomography, 57Fe Mössbauer spectroscopy and SQUID magnetometry. Thanks to its 3D imaging capabilities at the atomic scale, Atom Probe Tomography appears as the most suitable technique to investigate the Fe distribution in the 6H-SiC host semiconductor and to evidence secondary phases. This study definitely evidences the formation of Fe3Si nano-sized clusters after annealing. These clusters are unambiguously responsible for the main part of the magnetic properties observed in the annealed samples." @default.
• W1749479531 created "2016-06-24" @default.
• W1749479531 creator A5007715812 @default.
• W1749479531 creator A5029627511 @default.
• W1749479531 creator A5030364536 @default.
• W1749479531 creator A5036414170 @default.
• W1749479531 creator A5041935682 @default.
• W1749479531 creator A5042334527 @default.
• W1749479531 creator A5049206054 @default.
• W1749479531 creator A5050132020 @default.
• W1749479531 creator A5066083005 @default.
• W1749479531 creator A5075968052 @default.
• W1749479531 creator A5086920185 @default.
• W1749479531 creator A5089741365 @default.
• W1749479531 date "2015-05-14" @default.
• W1749479531 modified "2023-10-18" @default.
• W1749479531 title "Fe-implanted 6H-SiC: Direct evidence of Fe₃Si nanoparticles observed by atom probe tomography and ⁵⁷Fe Mössbauer spectroscopy" @default.
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• W1749479531 doi "https://doi.org/10.1063/1.4921056" @default.

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