Matches in SemOpenAlex for { <https://semopenalex.org/work/W1796231437> ?p ?o ?g. }
- W1796231437 endingPage "128" @default.
- W1796231437 startingPage "109" @default.
- W1796231437 abstract "Variability is a central issue in deep submicron technologies, in which it becomes increasingly difficult to produce two chips with the same behavior. While the impact of variability is well understood from the microelectronic point of view, very few works investigated its significance for cryptographic implementations. This is an important concern as 65-nanometer and smaller technologies are soon going to equip an increasing number of security-enabled devices. Based on measurements performed on 20 prototype chips of an AES S-box, this paper provides the first comprehensive treatment of variability issues for side-channel attacks. We show that technology scaling implies important changes in terms of physical security. First, common leakage models (e.g. based on the Hamming weight of the manipulated data) are no longer valid as the size of transistors shrinks, even for standard CMOS circuits. This impacts both the evaluation of hardware countermeasures and formal works assuming that independent computations lead to independent leakage. Second, we discuss the consequences of variability for profiled side-channel attacks. We study the extend to which a leakage model that is carefully profiled for one device can lead to successful attacks against another device. We also define the perceived information to quantify this context, which generalizes the notion of mutual information with possibly degraded leakage models. Our results exhibit that existing side-channel attacks are not perfectly suited to this new context. They constitute an important step in better understanding the challenges raised by future technologies for the theory and practice of leakage resilient cryptography." @default.
- W1796231437 created "2016-06-24" @default.
- W1796231437 creator A5027229899 @default.
- W1796231437 creator A5037706770 @default.
- W1796231437 creator A5040655807 @default.
- W1796231437 creator A5064026729 @default.
- W1796231437 creator A5070542865 @default.
- W1796231437 date "2011-01-01" @default.
- W1796231437 modified "2023-09-23" @default.
- W1796231437 title "A Formal Study of Power Variability Issues and Side-Channel Attacks for Nanoscale Devices" @default.
- W1796231437 cites W1499081748 @default.
- W1796231437 cites W1511843316 @default.
- W1796231437 cites W1557077103 @default.
- W1796231437 cites W1562542037 @default.
- W1796231437 cites W1563465674 @default.
- W1796231437 cites W1573157032 @default.
- W1796231437 cites W1600693085 @default.
- W1796231437 cites W1724890242 @default.
- W1796231437 cites W1752847028 @default.
- W1796231437 cites W1794592934 @default.
- W1796231437 cites W1803499338 @default.
- W1796231437 cites W1838677899 @default.
- W1796231437 cites W1862426464 @default.
- W1796231437 cites W1943109301 @default.
- W1796231437 cites W1945373036 @default.
- W1796231437 cites W1978232794 @default.
- W1796231437 cites W1982515552 @default.
- W1796231437 cites W2022622846 @default.
- W1796231437 cites W2083451059 @default.
- W1796231437 cites W2097916567 @default.
- W1796231437 cites W2099136161 @default.
- W1796231437 cites W2099724084 @default.
- W1796231437 cites W2101368424 @default.
- W1796231437 cites W2131862714 @default.
- W1796231437 cites W2133701468 @default.
- W1796231437 cites W2154909745 @default.
- W1796231437 cites W2914572864 @default.
- W1796231437 doi "https://doi.org/10.1007/978-3-642-20465-4_8" @default.
- W1796231437 hasPublicationYear "2011" @default.
- W1796231437 type Work @default.
- W1796231437 sameAs 1796231437 @default.
- W1796231437 citedByCount "94" @default.
- W1796231437 countsByYear W17962314372012 @default.
- W1796231437 countsByYear W17962314372013 @default.
- W1796231437 countsByYear W17962314372014 @default.
- W1796231437 countsByYear W17962314372015 @default.
- W1796231437 countsByYear W17962314372016 @default.
- W1796231437 countsByYear W17962314372017 @default.
- W1796231437 countsByYear W17962314372018 @default.
- W1796231437 countsByYear W17962314372019 @default.
- W1796231437 countsByYear W17962314372020 @default.
- W1796231437 countsByYear W17962314372021 @default.
- W1796231437 countsByYear W17962314372022 @default.
- W1796231437 countsByYear W17962314372023 @default.
- W1796231437 crossrefType "book-chapter" @default.
- W1796231437 hasAuthorship W1796231437A5027229899 @default.
- W1796231437 hasAuthorship W1796231437A5037706770 @default.
- W1796231437 hasAuthorship W1796231437A5040655807 @default.
- W1796231437 hasAuthorship W1796231437A5064026729 @default.
- W1796231437 hasAuthorship W1796231437A5070542865 @default.
- W1796231437 hasBestOaLocation W17962314371 @default.
- W1796231437 hasConcept C113775141 @default.
- W1796231437 hasConcept C139719470 @default.
- W1796231437 hasConcept C149635348 @default.
- W1796231437 hasConcept C151730666 @default.
- W1796231437 hasConcept C157125643 @default.
- W1796231437 hasConcept C162324750 @default.
- W1796231437 hasConcept C178489894 @default.
- W1796231437 hasConcept C2777042071 @default.
- W1796231437 hasConcept C2779201187 @default.
- W1796231437 hasConcept C2779343474 @default.
- W1796231437 hasConcept C38652104 @default.
- W1796231437 hasConcept C41008148 @default.
- W1796231437 hasConcept C46331935 @default.
- W1796231437 hasConcept C49289754 @default.
- W1796231437 hasConcept C57273362 @default.
- W1796231437 hasConcept C63361517 @default.
- W1796231437 hasConcept C73150493 @default.
- W1796231437 hasConcept C76155785 @default.
- W1796231437 hasConcept C86803240 @default.
- W1796231437 hasConcept C94520183 @default.
- W1796231437 hasConceptScore W1796231437C113775141 @default.
- W1796231437 hasConceptScore W1796231437C139719470 @default.
- W1796231437 hasConceptScore W1796231437C149635348 @default.
- W1796231437 hasConceptScore W1796231437C151730666 @default.
- W1796231437 hasConceptScore W1796231437C157125643 @default.
- W1796231437 hasConceptScore W1796231437C162324750 @default.
- W1796231437 hasConceptScore W1796231437C178489894 @default.
- W1796231437 hasConceptScore W1796231437C2777042071 @default.
- W1796231437 hasConceptScore W1796231437C2779201187 @default.
- W1796231437 hasConceptScore W1796231437C2779343474 @default.
- W1796231437 hasConceptScore W1796231437C38652104 @default.
- W1796231437 hasConceptScore W1796231437C41008148 @default.
- W1796231437 hasConceptScore W1796231437C46331935 @default.
- W1796231437 hasConceptScore W1796231437C49289754 @default.
- W1796231437 hasConceptScore W1796231437C57273362 @default.
- W1796231437 hasConceptScore W1796231437C63361517 @default.
- W1796231437 hasConceptScore W1796231437C73150493 @default.