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- W1805136487 abstract "In conventional metal-induced-laterally crystallized (MILC) thin film transistors (TFTs), the source and drain regions are crystallized by metal-induced crystallization (MIC) self-aligned to the edges of the gate electrodes. A distinct grain boundary exists at the border between the MILC and the MIC regions. It will be shown that the apparent threshold voltage (V/sub t/) of the MILC TFTs is affected by the presence of these MILC/MIC grain boundaries (MMGBs) at the edges of the transistor channels. Furthermore, V/sub t/ can be reduced either by eliminating the MMGBs from both the source and drain junctions or by hydrogen passivation of the traps in the MMGBs." @default.
- W1805136487 created "2016-06-24" @default.
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- W1805136487 date "2003-01-20" @default.
- W1805136487 modified "2023-10-01" @default.
- W1805136487 title "Reduction of threshold voltage in metal-induced-laterally-crystallized thin film transistors" @default.
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- W1805136487 doi "https://doi.org/10.1109/asid.1999.762763" @default.
- W1805136487 hasPublicationYear "2003" @default.
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