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• W18373993 abstract "The last couple of years have been very busy for the semiconductor industry and researchers. The rapid speed of production channel length reduction has brought lithographic challenges to semiconductor modeling. These include stress optimization, transistor reliability and efficient circuit design with respect to interconnects, power and leakage at the chip level. This e-book focuses on the latest semiconductor techniques devised to address these issues. It should be a useful resource for electronic engineers and semiconductor chip designers." @default.
• W18373993 created "2016-06-24" @default.
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• W18373993 date "2010-12-31" @default.
• W18373993 modified "2023-10-16" @default.
• W18373993 title "Recent Topics on Modeling of Semiconductor Processes, Devices, and Circuits" @default.
• W18373993 doi "https://doi.org/10.2174/97816080507411110101" @default.
• W18373993 hasPublicationYear "2010" @default.
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