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- W1837751279 abstract "The paper describes a method to analyze arbitrary metallization thickness on a coupled microstrip line for RF MEMS passive device design. Using a conformal mapping technique, closed-form expression quasi-static parameters for the metallization thickness of coupled microstrip lines are determined. They are found to be accurate compared with simulation tools. By using this method, the even-odd mode impedance of coupled microstrip lines for arbitrary metallization thickness can be obtained." @default.
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- W1837751279 date "2005-12-13" @default.
- W1837751279 modified "2023-10-06" @default.
- W1837751279 title "Quasi-Static Parameter Analysis for Arbitrary Metallization Thickness of RF MEMS Coupled Microstrip Lines" @default.
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- W1837751279 doi "https://doi.org/10.1109/aps.2005.1552031" @default.
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