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- W1845462324 abstract "With the advent of VLSI, testing has become one of the most costly, complicated, and time consuming problems. The method of syndrome- testing is applicable toward VLSI testing since it does not require test generation and fault simulation. It can also be considered as a vehicle for self-testing. In order to employ syndrome-testing in VLSI, we electronically partition the chip into macros in test mode. The macros are then syndrome tested in sequence." @default.
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- W1845462324 date "1981-12-01" @default.
- W1845462324 modified "2023-09-27" @default.
- W1845462324 title "The Weighted Syndrome Sums Approach to VLSI Testing" @default.
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- W1845462324 doi "https://doi.org/10.1109/tc.1981.1675744" @default.
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