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- W1880950716 abstract "This tutorial paper discusses device and process optimization techniques that may be employed in the design of current state-of-the-art bulk silicon DRAM technology. MOSFET performance and reliability issues are contrasted." @default.
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- W1880950716 date "2002-11-23" @default.
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- W1880950716 title "Device design methodology and reliability strategy for deep sub-micron technology [DRAMs]" @default.
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